For a complete data sheet, please also download: • The IC04 LOCMOS HEB Logic. Family Specifications HEF, HEC. • The IC04 LOCMOS. HEFBP datasheet, HEFBP pdf, HEFBP data sheet, datasheet, data sheet, pdf, Philips, Dual 4-channel analogue multiplexer/demultiplexer. DATA SHEET. Product specification. Supersedes data of Aug May INTEGRATED CIRCUITS. 74HC; 74HCT
Isolation OFF-state as a function of frequency Fig A 10 of 26? Exposure to limiting values for extended periods may affect device reliability.
Limiting values Table 4.
This document contains data from the preliminary speci? Test circuit 5 Vos dB 3 aad 1? Product data sheet Rev.
HEFBP Datasheet pdf – Dual 4-channel analogue multiplexer/demultiplexer – Philips
Vos is the output voltage at a nYn or nZ terminal, whichever is assigned as an output. When supply voltages VCC?
The device is speci? Dynamic characteristics Table 9. Logic symbol Dataxheet 2. When using a supply of 2 V, it is recommended to use these devices only for transmitting digital signals. Test circuit for measuring AC performance Table Legal texts have been adapted to the new company name where appropriate. Recommended operating conditions Table 5.
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Test circuit for measuring crosstalk between control input and any switch VCC Sn 10? CPD is used to determine the dynamic power dissipation PD in? Please consult the most recently issued document before initiating or completing a design. VEE may not exceed Limiting values are datawheet ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied.
HEF datasheet, HEF datasheets, manuals for HEF electornic semiconductor part
The latest product status information is available on the Internet at URL http: Typical frequency response Fig Vos is the output voltage at pins nZ or nYn, whichever is assigned as an output. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number s and title. VEE V 12 Fig 7. The product status of device s described in this document may have changed since this document was published and may differ in case of multiple devices.
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